首页> 外文会议>Indium Phosphide and Related Materials, 2001. IPRM. IEEE International Conference On >Simultaneous measurements of transient photo-current andphotoluminescence for (Al0.7Ga0.3)0.5In0.5P/AlxIn1-xP-superlattices
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Simultaneous measurements of transient photo-current andphotoluminescence for (Al0.7Ga0.3)0.5In0.5P/AlxIn1-xP-superlattices

机译:同时测量瞬态光电流和(Al 0.7 Ga 0.3 0.5 In的光致发光 0.5 P / Al x In 1-x P超晶格

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The photoluminescence and the photo-current are simultaneouslymeasured for indirect transition type undoped(Al0.7Ga0.3)0.5In0.5P/AlxIn1-xP (x=0.53 and 0.57) superlattices. Biasvoltage is applied to the semi-transparent Au electrode on the epitaxiallayer. From measurements of the sample with x=0.53 (lattice matched tothe GaAs substrate) under a bias voltage of +0.3 V, it is found that thecarrier transport affects the PL decay curve only slightly. The latteris dominated by radiative carrier recombination. The surface electricfield of the sample without electrodes is estimated to be less than3×103 V/cm. For the sample with x=0.57, the energystates originating from the crystal defects act as carrier traps under alow electric field, and levels which contribute to the tunneling ofelectrons through the barriers under a high electric field
机译:同时光致发光和光电流 未录制间接转换类型 (Al 0.7 ga 0.3 0.5 0.5 p / al中 x 1-x p(x = 0.53和0.57)超晶格中。偏见 将电压施加到外延上的半透明AU电极 层。从x = 0.53的样品测量(格子匹配 GaAs基板)在+0.3V的偏置电压下,发现了 载波运输仅略微影响PL衰减曲线。后者 以辐射载体重组为主。表面电动 估计没有电极的样品的领域仍然小于 3×10 3 v / cm。对于具有x = 0.57的样品,能量 源自晶体缺陷的状态充当载体陷阱 低电场,以及有助于隧道的水平 通过高电场下的障碍物

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