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Calculations of cut-off frequency, breakdown voltage and capacitance for diffused junctions in thin epitaxial layers

机译:薄外延层中扩散结的截止频率,击穿电压和电容的计算

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Recent developments in high quality silicon varactors for low-noise parametric amplifiers and high-efficiency harmonic generators necessitate the use of epitaxial silicon layers that are thinner than 10 microns, with resistivity less than 1 Ω-cm. This paper extends Breitschwerdt's recent calculations to such thin epitaxial layers and also includes the calculation of series resistance and capacitance per unit area in a range useful for microwave diode design.
机译:用于低噪声参数放大器和高效率谐波发生器的高质量硅变容二极管的最新发展,需要使用厚度小于10微米,电阻率小于1Ω-cm的外延硅层。本文将Breitschwerdt最近的计算扩展到了这样的薄外延层,并且还包括了对微波二极管设计有用的范围内的每单位面积的串联电阻和电容的计算。

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