首页> 外文会议>Microsystems,Packaging,Assembly Circuits Technology Conference,(IMPACT),2008 3rd International >On the Effect of Cell Geometry on the Amorphization Process in Phase-Change Memories
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On the Effect of Cell Geometry on the Amorphization Process in Phase-Change Memories

机译:关于单元格几何形状对相变存储器中非晶化过程的影响

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In phase change memories, the crystalline to amorphous phase transition is strongly affected by the cell geometry. In this paper, we study the amorphization process by analyzing the effects of amorphizing (RESET) pulses on the phase distribution inside the active chalcogenide portion of the memory cell. The purpose is to investigate how the shape and the volume of the amorphous cap are affected by the cell structure. In particular, the analysis is carried out considering two of the most popular cell architectures, namely, the Lance and the Pillar structures.
机译:在相变存储器中,晶格到非晶相的转变受单元几何形状的强烈影响。在本文中,我们通过分析非晶化(RESET)脉冲对存储单元有源硫族化物部分内部相位分布的影响来研究非晶化过程。目的是研究无定形帽的形状和体积如何受到晶胞结构的影响。特别地,分析是考虑到两种最流行的单元架构,即Lance和Pillar结构。

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