Weighted random pattern testing is now widely accepted as a veryeconomic way for external testing as well as for implementing a built-inself-test (BIST) scheme. The weights may be computed either bystructural analysis or by extracting the required information from aprecomputed deterministic test set. In this paper, we present a methodfor generating deterministic test patterns which can easily betransformed into weight sets. These test patterns contain only minimalredundant information such that the weight generation process is notbiased, and the patterns are grouped such that the conflicts within agroup are minimized. The quality of the weight sets obtained this way issuperior to the approaches published so far with respect to a smallnumber of weights and weighted patterns, and a complete fault coveragefor all the ISCAS-85 and ISCAS-89 benchmark circuits
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