Proceedings of European Design and Test Conference

摘要

The following topics were dealt with: formal verification; system design for digital broadband telecommunications; BIST pattern generation; high-level synthesis; fault analysis and test quality; code generation; test and BIST beyond chips; transformations and estimations; FPGA placement and routing; self-test methodologies; emerging design techniques; low power design; performance-driven routing; mixed-signal circuit test generation; heterogeneous system modelling and design; digital circuit design; high speed signal processing; sequential logic synthesis; from high level verification to low level extraction; sequential test generation; module generators; memory testing; microsystems design environments and CAD tools; partitioning; synthesis and testability; integrated system design; simulation techniques; DFT solutions and I_DDQ.