首页> 外文会议>Electron Devices Meeting, 2003. IEDM '03 Technical Digest. IEEE International >70nm NAND flash technology with 0.025 μm2 cell size for 4Gb flash memory
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70nm NAND flash technology with 0.025 μm2 cell size for 4Gb flash memory

机译:70nm NAND闪存技术,单元大小为0.025μm 2 ,用于4Gb闪存

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摘要

A 4 Gb NAND flash memory with a 70 nm design rule is developed for mass storage applications. The cell size is 0.025 μm2, which is the smallest value ever reported. For the integration, an ArF lithography process along with resolution enhancing techniques was utilized, and poly-Si/W gate technology with an optimized re-oxidation process was implemented.
机译:为大容量存储应用开发了具有70 nm设计规则的4 GB NAND闪存。电池尺寸为0.025μm 2 ,这是迄今为止最小的值。对于集成,利用ARF光刻工艺以及分辨率增强技术,并实施具有优化的重新氧化过程的多Si / W栅极技术。

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