首页> 外文会议>University of Bristol;EMAS Regional Workshop: Microbeam Analysis in the Earth Sciences;Mineralogical Society of Great Britain and Ireland;European Microbeam Analysis Society >HIGH-ANGULAR RESOLUTION ELECTRON BACKSCATTER DIFFRACTION AS A NEW TOOL FOR MAPPING LATTICE DISTORTION IN GEOLOGICAL MATERIALS
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HIGH-ANGULAR RESOLUTION ELECTRON BACKSCATTER DIFFRACTION AS A NEW TOOL FOR MAPPING LATTICE DISTORTION IN GEOLOGICAL MATERIALS

机译:高角分辨率电子背散射是一种映射地质材料中晶格畸变的新工具

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Electron backscatter diffraction (EBSD) in the scanning electron microscope has become centralto microstructural analysis in a wide range of geoscience subdisciplines. In particular, EBSD isemployed intensively to investigate the microstructures of deformed rocks. However, conventionalEBSD, based on indexing the Hough transform of each diffraction pattern, reveals only a fractionof the information on intragranular deformation that is stored in each pattern. Recent work in thematerials sciences has generated a new approach to analysing diffraction patterns based on crosscorrelation of multiple regions of interest between patterns. This method, termed high-angularresolution electron backscatter diffraction (HR-EBSD), offers several advantages overconventional EBSD for analysis of intragranular lattice distortions. The cross-correlation basedapproach improves precision in misorientation angles by approximately an order of magnitude toaround 0.01°. This precision allows lower densities of geometrically necessary dislocations to beresolved. Moreover, the associated misorientation axes are much better constrained, even for smallmisorientation angles. These improved constraints aid determination of the types of dislocationsthat generate lattice curvature. A further major advantage of HR-EBSD is that it maps elastic strainof the lattice, which is not analysed at all by conventional EBSD, with precision on the order of10-4. These measurements are relative to the strain state of a reference point within each grain andtherefore quantify intragranular strain heterogeneity. With knowledge of the elastic constants, thestrains are used to calculate intragranular residual stress heterogeneity, with precision on the orderof tens of megapascals. Simple examples of HR-EBSD datasets from experimentally deformedolivine and naturally deformed quartz demonstrate each of these advantages of HR-EBSD analysis.These capabilities open a wealth of opportunities to gain new insights into the details ofdeformation microstructures and the geological processes that cause and are influenced by them.
机译:扫描电子显微镜中的电子背散射衍射(EBSD)已成为中心 在广泛的地球科学子学科中进行微观结构分析。特别是,EBSD是 广泛用于研究变形岩石的微观结构。但是,常规 EBSD基于索引每个衍射图的霍夫变换,仅揭示了一部分 存储在每个模式中的有关晶内变形的信息。最近的工作 材料科学已经产生了一种新的方法来分析基于交叉的衍射图 模式之间多个感兴趣区域的相关性。这种方法称为高角度 分辨率电子背散射衍射(HR-EBSD),与 传统的EBSD,用于分析晶内晶格畸变。基于互相关 这种方法可将误定向角的精度提高大约一个数量级,达到 约0.01°。这种精度允许较低的几何必要位错密度 解决。此外,即使对于较小的轴,也可以更好地约束相关的方向错误的轴。 方向错误的角度。这些改进的约束条件有助于确定脱位类型 产生晶格曲率。 HR-EBSD的另一个主要优点是它可以映射弹性应变 晶格的数量,传统的EBSD根本不分析晶格,其精度约为 10-4。这些测量相对于每个晶粒内参考点的应变状态,以及 因此,可以量化颗粒内应变的异质性。了解弹性常数后, 应变用于计算晶内残余应力异质性,精度约为 数十兆帕斯卡。来自实验变形的HR-EBSD数据集的简单示例 橄榄石和自然变形的石英展示了HR-EBSD分析的所有这些优点。 这些功能为您提供了许多机会,可获取有关以下方面的新见解: 变形微结构以及导致它们并受其影响的地质过程。

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