Method for determination of lattice parameters of crystalline materials by electron diffraction high resolution

摘要

Method for determination of lattice parameters of crystalline materials by electron diffraction high resolution. # Allows to measure lattice parameters of crystals of varying sizes present in monocrystalline and polycrystalline materials from diffraction of electrons collected in transmission electron microscopes. # with this method lattice distances are measured from diffraction electron selected area (SAED), which allows to measure the lattice parameters of thin films and even reasons of nanometric sizes. # calculations taking into account calibration length values ​​real camera and the presence of distortions which may be modified diffraction patterns. # is a useful tool for the study and development of new crystalline materials with application in the field of advanced materials technology.