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Stray light characterization in a high-resolution imaging spectrometer designed for solar-induced fluorescence

机译:高分辨率成像光谱仪中杂散光的表征,该光谱仪专为太阳诱发的荧光而设计

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New commercial-off-the-shelf imaging spectrometers promise the combination of high spatial and spectral resolutionneeded to retrieve solar induced fluorescence (SIF). Imaging at multiple wavelengths for individual plants and evenindividual leaves from low-altitude airborne or ground-based platforms has applications in agriculture and carbon-cyclescience. Data from these instruments could provide insight into the status of the photosynthetic apparatus at scales of spaceand time not observable with tools based on gas exchange, and could support the calibration and validation activities ofcurrent and forthcoming space missions to quantify SIF. High-spectral resolution enables SIF retrieval from regions ofstrong telluric absorption by molecular oxygen, and also within numerous solar Fraunhofer lines in atmospheric windowsnot obscured by oxygen or water absorptions. Because the SIF signal can be < 5 % of background reflectance, rigorousinstrument characterization and reduction of systematic error is necessary. Here we develop a spectral stray-light correctionalgorithm for a commercial off-the-shelf imaging spectrometer designed to quantify SIF. We use measurements from anoptical parametric oscillator laser at 44 wavelengths to generate the spectral line-spread function and develop a spectralstray-light correction matrix using a novel exposure-bracketing method. The magnitude of spectral stray light in thisinstrument is small, but spectral stray light is detectable at all measured wavelengths. Examination of corrected line-spreadfunctions indicates that the correction algorithm reduced spectral stray-light by 1 to 2 orders of magnitude.
机译:新型商用现成成像光谱仪有望实现高空间分辨率和光谱分辨率的结合 需要检索太阳感应荧光(SIF)。对单个植物甚至多个波长进行成像 来自低空机载或地面平台的单个叶子在农业和碳循环中有应用 科学。这些仪器的数据可以洞察光合作用在空间尺度上的状态 和时间是使用基于气体交换的工具所无法观察到的,并且可以支持校准和验证活动 当前和即将进行的太空飞行任务以量化SIF。高光谱分辨率可从以下区域进行SIF检索 分子氧具有很强的碲吸收能力,并且在大气窗口中的众多太阳弗劳恩霍夫射线中 不会被氧气或水的吸收所遮盖。由于SIF信号可能小于背景反射率的5%,因此严格 仪器表征和减少系统误差是必要的。在这里,我们开发了光谱杂散光校正 用于量化SIF的商用现货成像光谱仪的算法我们使用来自 光学参量振荡器激光器,用于44个波长,以产生光谱线扩展功能并产生光谱 使用新颖的包围曝光方法的杂散光校正矩阵。在此光谱杂散光的大小 仪器很小,但是在所有测得的波长下都能检测到光谱杂散光。检查校正的线散度 函数表明校正算法将频谱杂散光减少了1到2个数量级。

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