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UV-enhanced avalanche photodiode array for fluorescence applications

机译:用于荧光应用的紫外线增强雪崩光电二极管阵列

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Abstract: We have developed avalanche photodiode (APD) arrays ofthe beveled edge type with high responsivity in theultraviolet (UV) region. A 3 $MUL 3 array with pixelsize 3 $MUL 3 mm$+2$/ was made, in which thesegmentation was done using selective diffusion in thefront surface. This technique is an improvement overprevious avalanche photodiodes, where the segmentationwas done cutting channels in the back of the detector.After the die was cut from the wafer, beveling andpassivation was performed to avoid lateral surfacebreakdown. The responsivity from 200 to 400 nm is closeto 1.1 A/W., which makes this detector suitable forflorescence applications. The gain and dark currentcoming from all pixels connected together, is the sameas a single element detector with the same area, whichindicates that the pixelization process does not reducethe performance compared to a detector withoutsegmentation. We measured high crosstalk betweenadjacent pixels (30%) which indicates that theresistance between them is too low. !12
机译:摘要:我们已经开发了在紫外线(UV)区域具有高响应度的斜边型雪崩光电二极管(APD)阵列。制成具有像素大小为3 $ MUL 3 mm $ + 2 $ /的3 $ MUL 3阵列,其中使用在前表面的选择性扩散进行碎片化。该技术是对先前雪崩光电二极管的一种改进,在雪崩光电二极管中,分割是在检测器背面切割通道。从晶片上切下晶片后,进行倒角和钝化处理以避免侧面表面破裂。从200到400 nm的响应度接近1.1 A / W。,这使得该检测器适用于荧光应用。来自连接在一起的所有像素的增益和暗电流与具有相同面积的单元素检测器相同,这表明与没有分段的检测器相比,像素化过程不会降低性能。我们测量了相邻像素之间的高串扰(30%),这表明它们之间的电阻太低。 !12

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