首页> 外文会议>Electronic Components amp; Technology Conference, 2000. 2000 Proceedings. 50th >A new method for comparing migration abilities of conductor systemsbased on conventional electroanalytical techniques
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A new method for comparing migration abilities of conductor systemsbased on conventional electroanalytical techniques

机译:一种比较导体系统迁移能力的新方法基于常规的电分析技术

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There are various metallization types, pure metals as well asalloys, showing very different abilities for migration. Their comparisonis available only through empirical way. There are two mainpossibilities for getting information or comparison about the migrationbehavior of a sample: the water drop test and accelerated climatictests. The results are generally uncertain showing large spreading andcan only be interpreted with difficulties. Further problems are theundefined conditions and many subjective things with the Water Drop (WD)test while rather long periods of tests and special test chambers arenecessary to perform climatic tests. A third method has been developedand will be presented in the paper for testing metallization systemsbased on a powerful technique; this is the very well known cyclicvoltammetry used in the electroanalytical chemistry. The resultsindicate an effective method for making quick comparison betweenmetallization systems in connection with their migration abilities
机译:有多种金属化类型,纯金属以及 合金,显示出非常不同的迁移能力。他们的比较 仅可通过经验方式获得。主要有两个 获得有关迁移的信息或进行比较的可能性 样品的行为:水滴测试和加速的气候 测试。结果通常不确定,显示出较大的扩散和 只能有困难的解释。进一步的问题是 水滴(WD)带来的不确定条件和许多主观因素 在进行相当长时间的测试和特殊测试箱的同时进行测试 进行气候测试所必需的。已经开发出第三种方法 并将在论文中介绍以测试金属化系统 基于强大的技术;这是众所周知的循环 电分析化学中使用的伏安法。结果 表示一种有效的方法,可以快速比较 金属化系统及其迁移能力

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