An improved triaxial cell for transfer impedance measurements onmultipins backplane connectors

摘要

An improved triaxial cell for measuring the transfer impedance ofthe shields of multipins backplane connectors has been developed. Muchattention has been paid to the design of the outer and innertransmission line of the test cell. In particular the excitation of theconnector and the connection of the connector shield to the innerconductor of the test cell have been optimised which allowsdetermination of the transfer impedance up to 3 GHz. Various connectorconfigurations have been compared, showing a large influence of thesignal pin location in the connector and of the connector shields