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Study of TEM micrographs of thin-film cross-section replica using spectral analysis

机译:利用光谱分析研究薄膜横截面复制品的TEM显微照片

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摘要

Abstract: The method of spectral analysis for studying the TEM micrograph of thin film replicas is presented. It has been proven that there are spectral losses in the TEM micrograph that are concerned with the thickness of the replica. A TEM micrograph of the thin film cross section replica is studied with the aid of a computer.!5
机译:摘要:提出了利用光谱分析方法研究薄膜复制品的TEM显微照片的方法。已经证明,在TEM显微照片中存在与复制品的厚度有关的光谱损失。借助计算机研究了薄膜横截面复制品的TEM显微照片!! 5

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