Significance of pre- and post- EFI data processing to enhance dynamic electrical fault isolation success

摘要

It is a common perception that electrical fault isolation (EFI) is the heart of a successful integrated circuit failure analysis workflow. Much effort to enhance EFI approaches is vested on improving optical resolution and system signal-to-noise in order to meet performance demands of advanced technologies. In fact, pre- and post-EFI data processing procedures are equally important and capable to influence the success of fault localization significantly. We describe three different analytical workflows applied on actual SOC memory failures to demonstrate this importance.