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Improvement of Power Cycling Life under Typical Operating Conditions of a Power Semiconductor Module by Sn-based Solder Die Bonding

机译:通过锡基焊料芯片键合改善功率半导体模块典型工作条件下的功率循环寿命

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In order to meet the market demand for higher power density of power modules, it is important to improve the power cycling life of die bonding solder because the maximum current is limited by the power cycling life. We analyzed the mission profile of typical railway applications, establishing that the thermal load with short power on-time and small temperature amplitudes occur frequently. We estimated and compared the life of Sn-based solder die bonding and Pb-based solder die bonding under an assumed mission profile. In the life estimation, we considered a peculiar phenomenon of Sn-based solder, the “vertical crack”. A life prediction formula was constructed based on the physical phenomenon of “vertical crack”. The expected longer life of power semiconductor modules adopting Sn-based solder was validated not only under conventional power cycling bench testing but also through actual operation. Sn-based solderedmodules can sustain higher maximum currents during actual operation than conventional Pb-based soldered modules. For example, if the target life is 30 years, the maximum currents can be improved by 50% under a typical operating condition.
机译:为了满足市场需求对电力模块的更高功率密度,重要的是改善模具粘合焊料的动力循环寿命,因为最大电流受到功率循环寿命的限制。我们分析了典型的铁路应用的关联型材​​,建立了具有短功率和小的温度幅度的热负荷频繁发生。我们在假设的任务型材下估计并比较了SN基焊料模切和基于PB的焊料模切的寿命。在寿命估计中,我们认为SN基焊料的特殊现象,“垂直裂缝”。基于“垂直裂缝”的物理现象构建寿命预测公式。不仅在传统的动力循环台式测试下,还通过实际操作来验证采用SN基焊料的功率半导体模块的预期寿命。 SN基的SolderedModules可以在实际操作期间维持比传统的PB的焊接模块在实际操作期间维持更高的最大电流。例如,如果目标寿命为30年,则在典型的操作条件下,最大电流可提高50%。

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