In-Line Quality Control in Semiconductors Production and Availability for Industry 4.0

摘要

This paper exposes a new theoretical approach to in-line quality control that has a healthy effect on the operational availability of the automated production line for industry 4.0. Our philosophy of action is this: through an accurate analysis of the production processes and an appropriate flow of post-product test data (in our case: electronic components), it is possible to correct the quality drift of the product during the production itself without waiting for the lot to run out. All this greatly reduces the line's stop times with evident economic repercussions.