A Kriging Surrogate Modeling to the Sensitivity Analysis of Analog Circuits

摘要

This paper proposes an application of the Kriging-based metamodeling technique to build surrogate models to the sensitivity analysis of analog circuits. The main goal is to reduce computer time execution when such critical task. Two analog circuits are studied, namely a second generation CMOS current conveyor and a CMOS voltage follower. The relative average error is calculated to prove the accuracy of the constructed models.