首页> 外文会议>ASME International Technical Conference on Packaging and Integration of Electronic and Photonic Microsystems >ADDRESSING THE CHALLENGES IN LASER MICRO-MACHINING AND BONDING OF SILICON MICROCHANNEL COLD-PLATE AND 3D-MANIFOLD FOR EMBEDDED COOLING APPLICATIONS: PERFECT DEBRIS REMOVAL
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ADDRESSING THE CHALLENGES IN LASER MICRO-MACHINING AND BONDING OF SILICON MICROCHANNEL COLD-PLATE AND 3D-MANIFOLD FOR EMBEDDED COOLING APPLICATIONS: PERFECT DEBRIS REMOVAL

机译:解决嵌入式冷却应用中的硅微通道冷板和3D流形的激光微加工和粘接中的挑战:完美去除碎屑

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Laser machining is an inexpensive and fast alternative to conventional microfabrication techniques that produce complicated three-dimensional, hierarchical structures. One of the major issues plaguing the use of laser micromachining to manufacture commercially usable devices is the formation of debris during cutting and the difficulty in removing these debris efficiently after the machining process. For silicon substrates, this debris can interfere with surrounding components and cause problems during bonding with other substrates by preventing uniform conformal contact. This study summarizes several post-process techniques that can be employed for complete debris removal during etching of Silicon samples using an Nd/YVO_4 pulsed (~ 1 - 3 kW) UV laser, detailing the advantages and drawbacks of each approach. A method that was found to be particularly promising to achieve very smooth surfaces with almost complete debris removal was the use of PDMS as a high rigidity protective coating. In the process, a novel technique to strip PDMS from Silicon surface was developed and a study was carried out to optimize the process. The result of this study is very valuable to the micro-fabrication industry where smooth and clean substrate surfaces are highly desirable. This work could facilitate adoption and significant improvements to the process of using UV lasers to create microstructures for commercial applications as well as in a research environment.
机译:激光加工是生产复杂的三维层次结构的传统微加工技术的廉价且快速的替代品。困扰于使用激光微加工来制造可商业使用的设备的主要问题之一是在切割过程中形成碎屑,并且在加工过程之后难以有效地去除这些碎屑。对于硅基板,此碎屑会干扰周围的组件,并在防止与其他基板的粘合过程中通过防止均匀的共形接触而引起问题。这项研究总结了几种后处理技术,这些技术可用于使用Nd / YVO_4脉冲(〜1-3 kW)紫外激光蚀刻硅样品的过程中完全清除碎屑,并详细说明了每种方法的优缺点。人们发现将PDMS用作高刚性保护涂层是一种非常有希望获得非常光滑的表面且几乎可以完全清除碎屑的方法。在此过程中,开发了一种从硅表面剥离PDMS的新技术,并进行了研究以优化该过程。这项研究的结果对微型制造行业非常有价值,因为在微型制造行业中,非常需要光滑和干净的基板表面。这项工作可以促进对使用UV激光创建用于商业应用以及研究环境的微结构的过程的采用,并对其进行重大改进。

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