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Study on Kinetic Behavior and Adsorption Mechanism of the Micron Metal Dust Near the Basin-type Insulator in DC GIL

机译:DC GIL盆式绝缘子附近微米金属粉尘的动力学行为和吸附机理研究

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Metal dust of micron level is often generated in DC GIS/GIL, probably causing serious faults such as surface flashover of insulators. In this paper, a semi-closed coaxial cylindrical electrodes platform was built as to study the movement behavior and adsorption mechanism of the micron metal dust near the basin-type insulator, and unique phenomena were obtained. Firstly, two adsorption modes of dust were discovered. One is "accumulative adsorption" on the insulator, and the other is "diffusive adsorption" towards the high-voltage electrode and grounded electrode. Then, some special phenomena were observed. For accumulative adsorption, an obvious "polar effect" was found. The adsorbed range is wider, the adsorbed amount is larger and the adsorbing time is shorter when under negative voltage. And a "maximum value" of accumulative amount is found as voltage is increased. What’s more, the increase in amount of dust and voltage may lead to "explosion" of the metal dust. To account for the experimental phenomena, a stress analysis model under multi-physical fields were established. In the "V" shaped area formed by the insulator surface and dust heap, effects of electric field forces on dust particles cancel each other out. Hence, the key to accumulative adsorption turns to be the coulomb force of surface charge in insulator on charged particles. While the polarity of surface charge in insulator contributes directly to the polarity effect of accumulative adsorption. The main factor on diffusive adsorption lies in the distorted electric field force on the charged dust, and repulsion between them makes the distribution uniform. Finally, This paper considered that interaction between coulomb force and distorted field force causes the "maximum value" of accumulative adsorption. However, the mechanism of all special motion behavior remain to be further studied.
机译:微米水平的金属粉尘通常在DC GIS / GIL中产生,可能导致绝缘体的表面闪差等严重故障。在本文中,建立了半闭合同轴圆柱电极平台,以研究盆型绝缘体附近的微米金属粉尘的运动行为和吸附机理,并获得独特的现象。首先,发现了两种吸附模式。一种是绝缘体上的“累积吸附”,另一个是朝向高压电极和接地电极的“扩散吸附”。然后,观察到一些特殊现象。对于累积吸附,发现了明显的“极性效果”。吸附的范围更宽,吸附量较大,并且在负电压下时吸附时间较短。找到累积量的“最大值”作为电压增加。更重要的是,灰尘和电压量的增加可能导致金属粉尘的“爆炸”。为了考虑实验现象,建立了多物理领域的压力分析模型。在由绝缘体表面和灰尘堆形成的“V”形面积中,电场力对灰尘颗粒的影响互相抵消。因此,累积吸附的关键是在带电粒子上绝缘体中表面电荷的库仑力。虽然绝缘体中表面电荷的极性直接贡献累积吸附的极性效应。漫射吸附的主要因素位于带电灰尘上的扭曲电场力,并且它们之间的排斥力使得分布均匀。最后,本文认为库仑力与扭曲场力之间的相互作用导致累积吸附的“最大值”。然而,仍有进一步研究所有特殊运动行为的机制。

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