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Influence of Gate Connection Modes on Trade-offs in Trench Gate U-shaped Channel SOI-LIGBT

机译:栅极连接方式对沟槽栅极U形沟道SOI-LIGBT权衡的影响

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The influence of gate connection modes in the trench gate U-shaped (TGU) SOI-LIGBTs is investigated in this paper. The TGU SOI-LIGBT features a U-shaped gate trench (G1) and a U-shaped hole barrier trench (G2). In conventional gate connection mode, G2 and G1 are shorted and controlled by the gate signal synchronously. This mode results in a poor dv/dt (di/dt) controllability during the device turn-on. An excellent dv/dt (di/dt)-EON trade-off without affecting the EOFF-VON trade-off can be achieved through applying a novel gate connection mode with pre-charged G2.
机译:本文研究了沟槽连接U型(TGU)SOI-LIGBT中栅极连接方式的影响。 TGU SOI-LIGBT具有U形栅极沟槽(G1)和U形空穴阻挡沟槽(G2)。在传统的栅极连接模式下,G2和G1短路并由栅极信号同步控制。此模式导致设备开启期间的dv / dt(di / dt)可控性较差。出色的dv / dt(di / dt)-EON折衷,而不会影响E 关闭 -V 打开 可以通过应用带有预充电G2的新型栅极连接模式来实现折衷。

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