High Efficiency and Low Cost Solution on RFID Tag Measurement

摘要

In recent years, the concept of IoT (Internet of things) has developed swiftly. It becomes another information industry revolution after computer, internet and mobile communication. As the key technology on the IoT era, RFID (Radio Frequency Identification) has brought more motive force and new technological value. Therefore, the measurement on RFID tag becomes particularly crucial. The paper proposed an integrated solution on RFID tag test that includes on-board AMO module approach, protocol engine algorithms and reconfigurable strobe locating. Base on the completed solution, RFID tag measurement with high efficient time control and low cost hardware investment could be easily covered. What's more, the TPPP (Test Processor Per Pin) architecture enable excellent MSE (Multi Sites Efficiency) as well.