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Highly Reliable Four-Point Bending Test Using Stealth Dicing Method for Adhesion Evaluation

机译:使用隐形划片法进行高可靠性的四点弯曲测试以评估附着力

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In this study, a sandwich structure (silicon/polymer/silicon) was prepared to demonstrate the adhesion strength between polymer and silicon layers using a four-point bending system. For the first time, the stealth dicing (SD) method was applied to the silicon layer to generate an initial crack, and the SD method was compared with the traditional method of forming a trench by blade dicing. From the experimental results, the SD method improved the test yield and showed a lower level of sudden force drop. As a result, SD is a highly reliable way to measure the adhesion strength using a four-point bending system.
机译:在这项研究中,使用四点弯曲系统制备了三明治结构(硅/聚合物/硅),以证明聚合物和硅层之间的粘合强度。首次将隐形切割(SD)方法应用于硅层以产生初始裂纹,并将SD方法与通过刀片切割形成沟槽的传统方法进行了比较。从实验结果来看,SD方法提高了测试合格率,并显示出较低的突然力下降水平。因此,SD是使用四点弯曲系统测量粘合强度的高度可靠的方法。

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