首页> 外文会议>SPIE Optical Systems Design Conference >Effect of Visibility of the Fringes on the Tilt Measurement Using a Cyclic Interferometer and Polarization Phase Shifting
【24h】

Effect of Visibility of the Fringes on the Tilt Measurement Using a Cyclic Interferometer and Polarization Phase Shifting

机译:条纹可见度对使用循环干涉仪和偏振相移进行倾斜测量的影响

获取原文

摘要

Precise measurement of extremely small tilt angles is of immense importance in various scientific and technological applications. Interferometry has always been a tool of great importance in such applications. Most of the conventional interferometric techniques use a Michelson configuration and the problem with this interferometer is that it is extremely sensitive to environmental turbulances and vibrations. In our privious works, we had introduced a cyclic interferometer for the measurement of tilt angles which showed excellent stability against environmental turbulances and vibrations as well as twice the sensitivity. Also, with the introduction of multiple reflections, sensitivity as low as 5 micro radian had been achieved by us. To improve the sensitivity further, we had employed phase shifting techniques. The cyclic configuration being a same path interferometer, we used a polarizing phase shifting technique. For acieving this, we developed a new scheme of polarizing phase shifting techique which is rather simpler compared to those reported in the literature. With this we could precisely measure angles as low as 2 nano radians. However, in these measurements we found that the precise alignment of the quarter wave plate plays an important role in the visibility of the fringes which affects the accuracy of measurement. In this work, we numerically investigate the effect of the misalignment of the quarter wave plate on the visibility of the fringes and consequently on the accurcy of the measurement.
机译:精确测量极小的倾斜角度在各种科技应用中具有巨大的重要性。干涉测量始终是这种应用中非常重要的工具。大多数传统的干涉机械技术使用迈克尔逊配置和这种干涉仪的问题是它对环境湍流和振动非常敏感。在我们恐惧的作品中,我们引入了一种循环干涉仪,用于测量倾斜角度,这表达了对环境湍流和振动的优异稳定性以及敏感性的两倍。此外,随着引入多重反射,我们已经通过了低至5微弧度的敏感性。为了进一步提高敏感性,我们采用了相移技术。循环配置是相同的路径干涉仪,我们使用了偏振相移技术。对于辅助这一点,我们开发了一种新的偏振阶段转移技术方案,与文献中报道的那些相比相当更简单。通过这种情况,我们可以精确地测量低至2纳米弧度的角度。然而,在这些测量中,我们发现四分之一波片的精确对准在影响测量精度的条纹的可见性中起重要作用。在这项工作中,我们在数值上调查了四分之一波片的未对准对条纹的可见性的影响,从而对测量的准确性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号