首页> 外文会议>International Conference on Simulation of Semiconductor Processes and Devices >Investigation of the Electrode Materials in Conductive Bridging RAM from First-Principle
【24h】

Investigation of the Electrode Materials in Conductive Bridging RAM from First-Principle

机译:第一性原理研究导电桥接RAM中的电极材料

获取原文

摘要

Conductive bridging random access memories (CBRAM) are emerging non-volatile data storage devices whose switching mechanisms are not fully understood. Here, we present a modelling framework based on ab-initio simulations to investigate CBRAM cells. It combines density-functional theory and the Non-equilibrium Greens Function formalism. Realistic metallic filaments connecting two electrodes are constructed and their ballistic transport characteristics studied. For a given filament the type of counter electrode material has little influence on the magnitude of the ON-state current, but affects its spatial distribution. The conductance mainly depends on the material of the active electrode and the shape of the thinnest part of the filament.
机译:导电桥接随机存取存储器(CBRAM)是新兴的非易失性数据存储设备,其开关机制尚不完全清楚。在这里,我们提出了一个基于从头开始的模拟来研究CBRAM单元的建模框架。它结合了密度泛函理论和非平衡格林函数形式主义。构造了连接两个电极的真实金属丝,并研究了它们的弹道传输特性。对于给定的灯丝,对电极材料的类型对导通状态电流的大小影响很小,但会影响其空间分布。电导率主要取决于有源电极的材料和灯丝最薄部分的形状。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号