NONCONTACT ATOMIC FORCE MICROSCOPY IMAGING OF ANTIFERROMAGNETIC NIO(OOl) SURFACE USING FERROMAGNETIC FE-COATED SI TIP

摘要

The noncontact atomic force microscopy (NC-AFM) measures various kinds of interaction between tip and sample. In the case of a magnetic tip and sample, the interaction includes the long-range magnetic dipole interaction detected by magnetic force microscope and the short-range magnetic interaction. The short-range magnetic interaction energy depends on the electron spin state of the atoms, and the energy difference in spin alignments is referred to as the exchange interaction energy. Theoretical investigations [1-4] on the short-range magnetic interaction between a tip and a sample have been performed.