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Study on Space Charge Characteristics during Aging Process of DC ZnO Varistors

机译:DC ZnO压敏电阻老化过程中的空间电荷特性研究

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摘要

ZnO varistors are widely used in UHV arrester, the properties of ZnO varistors affect the safe and stable operation of the system, and there are relatively few micro characteristics of the aging process of dc ZnO varistors. In order to research the aging process of DC ZnO varistors, an aging experiment based on the actual working condition of UHV DC arrester is designed, combined with conventional Scanning Electron Microscope (SEM), Energy-Dispersive Spectrometer (EDS) and volt-ampere characteristic test, the ZnO varistors aging mechanism has been discussed from the perspective of space charge and barrier height change in this paper. Volt-ampere characteristic test and Scanning Electron Microscopy (SEM) aging test have found that AC and DC aging have obvious characteristic differences, The results of energy spectrum analysis revealed that there was the migration of zinc ion and Bi cation in the process of direct current aging, and has obvious accumulation phenomena in the single side. Space charge test results show that as the aging time increases, the space charge accumulates, and the surface charge density, the trap energy level and the trap charge are also increased, and the height of schottky barrier is obviously reduced, making the macroscopic electrical properties changes.
机译:ZnO压敏电阻广泛用于特高压避雷器中,ZnO压敏电阻的性能影响系统的安全稳定运行,并且直流ZnO压敏电阻的老化过程的微观特征相对较少。为了研究直流ZnO压敏电阻的老化过程,结合常规扫描电子显微镜(SEM),能量色散谱仪(EDS)和伏安特性,设计了基于特高压直流避雷器实际工作条件的老化实验。测试中,从空间电荷和势垒高度变化的角度讨论了ZnO压敏电阻的老化机理。伏安特性测试和扫描电子显微镜(SEM)老化测试发现,交流和直流老化具有明显的特性差异,能谱分析的结果表明,直流电过程中存在锌离子和铋阳离子的迁移老化,单面有明显的堆积现象。空间电荷测试结果表明,随着老化时间的增加,空间电荷积累,表面电荷密度,陷阱能级和陷阱电荷也随之增加,肖特基势垒的高度明显减小,从而使宏观电学性能提高。变化。

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