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Indium Nitride Nanowire Growth by Chemical Vapor Deposition and Electrical Characterization

机译:化学气相沉积和电学表征的氮化铟纳米线生长

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The Ill-nitrides have attracted great interest due to their wide range of applications from high efficiency solid-state lighting and photovoltaics to high-power and high temperature electronics. This paper presents a detailed study of InN nanowire morphology changes originating from the process parameters by chemical vapor deposition using In and NH_3 as source materials on SiO_2/Si substrates. Nickel catalysts with various forms have been used. The growth experiments have been carried out at temperatures between 800 and 1100°C under H_2 as carrier gas. Significant changes in nanowire size and morphology have been observed in accordance with the variations in process parameters. The sources of these variations and the growth mechanisms are discussed. In fact, the InN nanowire diameters range from 10 nm to 250 nm; and lengths up to 50 μm depending on the catalyst initial form. The grown nanowires and devices have been characterized by scanning electron microscopy (SEM), transmission electron microscopy (TEM), and semiconductor parameter analyzer.
机译:氮化铝由于其广泛的应用范围而引起了人们的极大兴趣,从高效固态照明和光伏发电到大功率和高温电子设备。本文对以In_2和NH_3为原料在SiO_2 / Si衬底上进行化学气相沉积的InN纳米线形貌变化进行了详细的研究。已经使用了各种形式的镍催化剂。已经在H_2作为载气的情况下,在800至1100°C的温度下进行了生长实验。根据工艺参数的变化,已经观察到纳米线尺寸和形态的显着变化。这些变化的来源和增长机制进行了讨论。实际上,InN纳米线的直径范围为10纳米至250纳米。长度最大为50μm,具体取决于催化剂的初始形式。生长的纳米线和装置已通过扫描电子显微镜(SEM),透射电子显微镜(TEM)和半导体参数分析仪进行了表征。

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