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An accurate subcircuit model of SiC half bridge module for switching loss optimization

机译:用于开关损耗优化的SiC半桥模块的精确子电路模型

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The increasing demand for high power density requires power converter to operate in high switching frequency. SiC power module is regarded as one of the most promising candidates for high-frequency applications due to the superior switching speed and low switching loss. The conventional strategy to optimize switching loss is normally achieved by repetitive double pulse tests, which is time-consuming to find an optimum gate resistance to achieve the trade-off between switching loss and EMI issues. In this work, an accurate SiC module subcircuit model is proposed. It considers the physical behavior of the device and can be directly extracted from the datasheet information. Good agreements are achieved between the PSpice simulation and experimental results in both switching waveform and switching loss. It also provides a guidance for gate driver design with a reasonable accuracy.
机译:对高功率密度的日益增长的需求要求功率转换器以高开关频率工作。 SiC功率模块因其出色的开关速度和低开关损耗而被认为是高频应用中最有希望的候选者之一。优化开关损耗的常规策略通常是通过重复的双脉冲测试来实现的,而重复的双脉冲测试则要花费很长时间才能找到最佳的栅极电阻,以在开关损耗和EMI问题之间进行权衡。在这项工作中,提出了一个精确的SiC模块子电路模型。它考虑了设备的物理行为,可以直接从数据表信息中提取。 PSpice仿真和实验结果在开关波形和开关损耗方面都达成了良好的协议。它还为合理的栅极驱动器设计提供了指导。

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