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Dual-threshold single-ended Schmitt-Trigger based SRAM cell

机译:基于双阈值单端施密特触发器的SRAM单元

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Data retention and power consumption during the hold mode of operation of a SRAM cell is of high importance. Hence, there is a need for a cell design that improves Static Noise Margin (SNM) and consumes low static power. This paper presents a Schmitt-Trigger (ST) based Single-Ended 11T SRAM cell that uses dual-threshold CMOS technology which exhibits high read and hold SNM and consumes low power during the hold operation. The cell is implemented in 45 nm CMOS technology using Cadence Virtuoso at supply voltage of 0.45 V. The simulation results show 89.11% decrease in the average static power dissipation of the proposed cell during the hold and read modes of operation and 38.93% decrease during write operation, when compared to that of the existing ST 11T SRAM cell for which the floating node is replaced with ground for simulation purposes.
机译:在SRAM单元的保持操作模式期间的数据保持和功耗非常重要。因此,需要一种改善静态噪声容限(SNM)并消耗低静态功率的单元设计。本文介绍了一种基于Schmitt-Trigger(ST)的单端11T SRAM单元,该单元使用双阈值CMOS技术,具有高读取和保持SNM的特性,并且在保持操作期间功耗低。该单元使用Cadence Virtuoso在0.45 V的电源电压下以45 nm CMOS技术实现。仿真结果表明,在保持和读取操作模式下,该单元的平均静态功耗降低了89.11%,而在写入过程中降低了38.93%与现有的ST 11T SRAM单元相比,现有的ST 11T SRAM单元的浮点被替换为接地,以进行仿真。

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