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Size-dependent carrier mobilities in rectangular silicon nanowire devices

机译:矩形硅纳米线器件中与尺寸有关的载流子迁移率

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Multi-gate transistors have attracted considerable attention as a way to overcome the scaling issues of planar MOSFETs. Although the effects of structural confinement on the carrier mobilities have been discussed extensively, the transition from silicon thin films to silicon nanowires (SiNWs) has been little investigated. In this contribution, we perform quantum calculations of the size-dependent carrier mobilities in gate-all-around rectangular SiNWs with leading dimension up to 50 nm, in the non-equilibrium Green's functions (NEGF) framework. We find that when the smallest width or height falls in the sub-10 nm range, nearest neighbor corner channels tend to merge and form “side channels” with much lower mobilities. On top of the numerical results, we have derived a simple model, which bridges square NW devices with thin film devices, and describes the size dependence of the carrier mobilities in rectangular SiNWs in a wide range of dimensions.
机译:作为克服平面MOSFET的定标问题的一种方法,多栅极晶体管已引起了相当大的关注。尽管已经广泛讨论了结构限制对载流子迁移率的影响,但很少研究从硅薄膜到硅纳米线(SiNWs)的过渡。在此贡献中,我们在非平衡格林函数(NEGF)框架中对前导尺寸高达50 nm的全栅矩形SiNW中依赖于尺寸的载流子迁移率进行了量子计算。我们发现,当最小宽度或高度落在10 nm以下范围内时,最近的邻角通道往往会合并并形成迁移率低得多的“侧通道”。根据数值结果,我们得出了一个简单的模型,该模型将方形NW器件与薄膜器件桥接在一起,并描述了矩形SiNW中载流子迁移率在尺寸范围内的大小依赖性。

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