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Strained silicon MOSFET having improved carrier mobility, strained silicon CMOS device, and methods of their formation

机译:具有改善的载流子迁移率的应变硅MOSFET,应变硅CMOS器件及其形成方法

摘要

The mobility enhancement of a strained silicon layer is augmented through incorporation of carbon into a strained silicon lattice to which strain is also imparted by an underlying silicon germanium layer. The presence of the relatively small carbon atoms effectively increases the spacing within the strained silicon lattice and thus imparts additional strain. This enhancement may be implemented for any MOSFET device including silicon on insulator MOSFETs, and is preferably selectively implemented for the PMOS components of CMOS devices to achieve approximately equal carrier mobility for the PMOS and NMOS devices.
机译:通过将碳结合到应变硅晶格中,可以增强应变硅层的迁移率,该应变硅晶格还通过下面的硅锗层赋予了应变。相对较小的碳原子的存在有效地增加了应变硅晶格内的间距,从而赋予了附加应变。可以针对包括绝缘体上MOSFET的硅的任何MOSFET器件实现这种增强,并且优选地针对CMOS器件的PMOS组件选择性地实现该增强,以实现PMOS和NMOS器件的载流子迁移率大致相等。

著录项

  • 公开/公告号US6849527B1

    专利类型

  • 公开/公告日2005-02-01

    原文格式PDF

  • 申请/专利权人 QI XIANG;

    申请/专利号US20030684727

  • 发明设计人 QI XIANG;

    申请日2003-10-14

  • 分类号H01L21425;H01L21265;H01L21265;

  • 国家 US

  • 入库时间 2022-08-21 22:19:31

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