首页> 外文会议>IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications >Fast model generation for AlGaN/GaN HEMTs with the consideration of self-heating and charge trapping effects
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Fast model generation for AlGaN/GaN HEMTs with the consideration of self-heating and charge trapping effects

机译:考虑到自热和电荷陷阱效应,可快速生成AlGaN / GaN HEMTs模型

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In this paper, a large signal model for AlGaN/GaN HEMTs is proposed which accounts for the thermal and trapping effects. Polynomials and overdetermined system is introduced to better address the complex thermal effect. The extraction is simple and fast compared with empirical models, since only solving overdetermined linear equations is required for the extraction of Ids. The extracted trapping and thermal related nonlinear coefficients are then represented by artificial neural network. Finally, a large signal model is constructed in Advanced Design System, and good agreements have been observed between the measured and simulated S-parameters, bias current, Pout, Gain and PAE under both 50Ohm and optimal load, which further validates the proposed model.
机译:在本文中,提出了一个用于AlGaN / GaN HEMT的大信号模型,该模型考虑了热效应和陷阱效应。为了更好地解决复杂的热效应,引入了多项式和超定系统。与经验模型相比,提取过程简单快捷,因为仅需要求解超定线性方程即可提取Ids。提取的俘获和与热有关的非线性系数然后由人工神经网络表示。最后,在高级设计系统中构建了一个大信号模型,并且在50Ohm和最佳负载下,观察到的和仿真的S参数,偏置电流,Pout,增益和PAE之间都观察到良好的一致性,从而进一步验证了所提出的模型。

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