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Reliability and performance trade-offs for 3D NoC-enabled multicore chips

机译:支持3D NoC的多核芯片的可靠性和性能之间的权衡

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Three-dimensional (3D) integration provides the benefits of better performance, lower power consumption, and increased bandwidth through the use of vertical interconnects and 3D stacking. The vertical interconnects enable the design of a high-bandwidth and energy-efficient small-world (SW) network-based 3D network-on-Chip (3D SWNoC) for massive multicore platforms. However, the anticipated performance gain of a 3D SWNoC-enabled multicore chip may be compromised due to the potential failures of through-silicon-vias (TSVs) that are predominantly employed as vertical interconnects. In particular, due to the non-homogeneous traffic patterns, heavily used TSVs may wear-out quickly and can also contribute to the wear-out of neighboring TSVs. As a result, the mean-time-to-failure (MTTF) of those TSVs will decrease, which will adversely affect the overall lifetime of the chip. In this paper, we address this traffic-dependent TSV wear-out problem in 3D SWNoC. We demonstrate that by employing an adaptive routing mechanism, we can improve the MTTF of 3D SWNoC significantly while still providing 21% lower energy-delay-product (EDP) compared to a conventional 3D MESH.
机译:三维(3D)集成通过使用垂直互连和3D堆栈提供了更好的性能,更低的功耗和增加的带宽的优势。垂直互连可以设计用于大型多核平台的基于高带宽和高能效的小型世界(SW)网络的3D片上网络(3D SWNoC)。但是,由于主要用作垂直互连的硅通孔(TSV)的潜在故障,可能会损害支持3D SWNoC的多核芯片的预期性能增益。特别地,由于不均匀的业务模式,频繁使用的TSV可能很快磨损,并且也可能导致相邻TSV的磨损。结果,这些TSV的平均故障时间(MTTF)将减少,这将对芯片的整体寿命产生不利影响。在本文中,我们解决了3D SWNoC中与流量相关的TSV磨损问题。我们证明,通过采用自适应路由机制,我们可以显着改善3D SWNoC的MTTF,同时与传统的3D MESH相比仍可提供21%的低能耗产品(EDP)。

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