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A design of 10-bit 25-MS/s SAR ADC using separated clock frequencies with high speed comparator in 180nm CMOS

机译:采用独立时钟频率和180nm CMOS高速比较器的10位25-MS / s SAR ADC设计

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A design of a 10-bit 25 MS/s Successive Approximation Register (SAR) Analog to Digital Converter (ADC) that uses improved dynamic comparator has been introduced in this paper. In this improved dynamic comparator, a novel pre-amplifier is proposed in order to enhance the bandwidth up to 817 MHz when compared to classical pre-amplifier structures. Besides, a modified dynamic latch with driving simultaneously gate and bulk terminals are also presented in this work. The whole of SAR ADC is designed and simulated in 180nm CMOS process with the structure based on the conventional architecture but reduced the capacitor array mismatch by using separated clock frequencies to control simultaneously comparator and SAR combination logic. Thus, this design works with the clock frequency of 0.5 GHz achieving a maximum sampling rate at 25 MS/s and 1.8V supply voltage. Without calibration technique, sampling at 25 MS/s, peak DNL and peak INL of original ADCs averaged across the array are 0.7 least significant bit (LSB) and 3.6 LSB, respectively.
机译:本文介绍了使用改进的动态比较器的10位25 MS / s逐次逼近寄存器(SAR)模数转换器(ADC)的设计。在这种改进的动态比较器中,提出了一种新颖的前置放大器,以便与传统的前置放大器结构相比,可以将带宽提高到817 MHz。此外,本文还提出了一种改进的动态锁存器,它同时驱动栅极和体端子。整个SAR ADC均采用基于传统体系结构的结构在180nm CMOS工艺中进行设计和仿真,但通过使用分开的时钟频率同时控制比较器和SAR组合逻辑,减少了电容器阵列的失配。因此,该设计以0.5 GHz的时钟频率工作,在25 MS / s和1.8V电源电压下实现了最大采样率。如果不使用校准技术,则以25 MS / s的采样速率,整个阵列上原始ADC的峰值DNL和峰值INL分别为0.7最低有效位(LSB)和3.6 LSB。

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