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Analytical loss model for power converters with SiC MOSFET and SiC schottky diode pair

机译:具有SiC MOSFET和SiC肖特基二极管对的功率转换器的分析损耗模型

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In this paper, a simple and accurate analytical loss model for Silicon Carbide (SiC) power devices is proposed. A novel feature of this loss model is that it considers the package and PCB parasitic elements in the circuits, nonlinearity of device junction capacitance and ringing loss. The proposed model identifies the switching waveform subintervals, and develops the analytical equations in each switching subinterval to calculate the switching loss. Inductive turn-on and turn-off are thoroughly analyzed. A double pulse test-bench is built to characterize inductive switching behavior of the SiC devices. The analytical results are compared with experimental results. The results show that the proposed loss model can predict switching loss more accurately than the conventional loss model.
机译:本文提出了一种简单而准确的碳化硅(SiC)功率器件分析损失模型。该损耗模型的一个新颖特征是,它考虑了电路中的封装和PCB寄生元件,器件结电容的非线性和振铃损耗。所提出的模型识别开关波形子间隔,并在每个开关子间隔中建立解析方程,以计算开关损耗。彻底分析了电感式导通和关断。建立了一个双脉冲测试台来表征SiC器件的感应开关行为。将分析结果与实验结果进行比较。结果表明,所提出的损耗模型可以比传统的损耗模型更准确地预测开关损耗。

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