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Spontaneous emission and reflectivity measurements for the characterization of facet-coatings of semiconductor lasers

机译:自发发射和反射率测量,用于表征半导体激光器的小面涂层

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摘要

A new method for measuring the spontaneous emissions and spectral reflectivity of the facet coating of ridge lasers is described and demonstrated. We present results of spectrally-controlled coated quantum-dot laser waveguides.
机译:描述和说明了一种测量自发排放的新方法和脊激光器的小平面涂层​​的光谱反射率。我们呈现光谱控制的涂覆量子点激光波导的结果。

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