Experimental characterization of the saturating, near infrared, self-amplified spontaneous emission free electron laser: Analysis of radiation properties and electron beam dynamics.

摘要

In this work, the main results of the VISA experiment (Visible to Infrared SASE Amplifier) are presented and analyzed. The purpose of the experiment was to build a state-of-the-art single pass self-amplified spontaneous emission (SASE) free electron laser (FEL) based on a high brightness electron beam, and characterize its operation, including saturation, in the near infrared spectral region. This experiment was hosted by Accelerator Test Facility (ATF) at Brookhaven National Laboratory, which is a users facility that provides high brightness relativistic electron beams generated with the photoinjector.; During the experiment, SASE FEL performance was studied in two regimes: a long bunch, lower gain operation; and a short bunch high gain regime. The transition between the two conditions was possible due to a novel bunch compression mechanism, which was discovered in the course of the experiment. This compression allowed the variation of peak current in the electron beam before it was launched into the 4-m VISA undulator. In the long bunch regime, a SASE FEL power gain length of 29 cm was obtained, and the generated radiation spectral and statistical properties were characterized.; In the short bunch regime, a power gain length of under 18 cm was achieved at 842 nm, which is at least a factor of two shorter than ever previously achieved in this spectral range. Further, FEL saturation was obtained before the undulator exit. The FEL system's performance was measured along the length of the VISA undulator, and in the final state. Statistical, spectral and angular properties of the short bunch SASE radiation have been measured in the exponential gain regime, and at saturation.; One of the most important aspects of the data analysis presented in this thesis was the development and use of start-to-end numerical simulations of the experiment. The dynamics of the ATF electron beam was modeled starting from the photocathode, through acceleration, transport, and inside the VISA undulator. The model allowed simulation of SASE process for different beam conditions, including the effects of the novel bunch compression mechanism on the electron beam 6-D phase space distribution. The numerical simulations displayed an excellent agreement with the experimental data, and became key to understanding complex dynamics of the SASE FEL process at VISA.