首页> 外文会议>IEEE International Symposium on Circuits and Systems >0.5-V sub-ns open-BL SRAM array with mid-point-sensing multi-power 5T cell
【24h】

0.5-V sub-ns open-BL SRAM array with mid-point-sensing multi-power 5T cell

机译:具有中点感应多功率5T单元的0.5V亚纳秒Open-BL SRAM阵列

获取原文

摘要

To achieve 0.5-V high-speed SRAMs, two proposals are demonstrated. One is a multi-power-supply five-transistor cell (5T cell), combined with a boosted word-line voltage and a mid-point sensing enabled by precharging bit-lines to V/2. The other is a partial activation of a multi-divided open-bit-line array without significant area penalty. Layout and post-layout simulation with a 28-nm fully-depleted planar-logic SOI MOSFET reveal that a 5T-cell 4-kb array in a 128-kb SRAM core is able to achieve x6 faster and x14 lower power than the counterpart 6T-cell array, suggesting a possibility of a 540-ps cycle time at 0.5 V.
机译:为了实现0.5V高速SRAM,演示了两个建议。一种是多电源五晶体管单元(5T单元),结合了增强的字线电压和通过将位线预充电至V / 2而实现的中点感测。另一个是多分割的开放位线阵列的部分激活,而没有明显的面积损失。使用28nm完全耗尽的平面逻辑SOI MOSFET进行布局和布局后仿真表明,在128kb SRAM内核中的5T单元4kb阵列比对等6T能够实现更快的x6速度和更低的x14功耗单元阵列,表明在0.5 V时540 ps周期时间的可能性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号