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0.5-V Sub-ns Open-BL SRAM Array with Mid-Point-Sensing Multi-Power 5T Cell

机译:0.5V子NS Open-BL SRAM阵列,带中点感测多功能5T单元

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To achieve 0.5-V high-speed SRAMs, two proposals are demonstrated. One is a multi-power-supply five-transistor cell (5T cell), combined with a boosted word-line voltage and a mid-point sensing enabled by precharging bit-lines to V_(DD)/2. The other is a partial activation of a multi-divided open-bit-line array without significant area penalty. Layout and post-layout simulation with a 28-nm fully-depleted planar-logic SOI MOSFET reveal that a 5T-cell 4-kb array in a 128-kb SRAM core is able to achieve x6 faster and x14 lower power than the counterpart 6T-cell array, suggesting a possibility of a 540-ps cycle time at 0.5 V.
机译:为实现0.5V高速SRAM,证明了两项提案。一个是多电源的五晶体管电池(5T电池),与升高的字线电压组合,并通过将位线预充电至V_(DD)/ 2而启用的中点感测。另一个是多分割的开放位线阵列的局部激活,而无需显着区域损失。使用28MM全耗尽平面逻辑SOI MOSFET的布局和后布局模拟显示,128-KB SRAM核心中的5T-Cell 4-KB阵列能够实现X6更快,x14比对方6T更低的功率-Cell阵列,建议在0.5 V时的540-PS循环时间的可能性。

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