An intelligent and reusable verification platform based on UVM for RFID digital baseband

摘要

The verification kit for RFID system based on hardware is difficult for engineers to debug. Therefore, in this paper an intelligent verification environment for RFID using UVM is built to improve efficiency. Firstly, a design of RFID digital baseband is introduced. Then an intelligent structure based on UVM and comprised of four test modes is presented. With the aspect-oriented and transaction level modeling, a reusable verification with high efficiency has been achieved.