chemical mechanical polishing; cutting tools; industrial manipulators; interpolation; optical scanners; recycling; 2D laser scanner; CMP pad recycling; chemical mechanical polishing pad; chip miniaturization; circular groove measurement; cutting-tool trajectory; error margin; integrated circuit chip; lattice groove measurement; manufacturing process; multistratified semiconductor structures; pad grooves; pad shape error; path-planning method; piecewise linear interpolation method; polishing pads; recutting process; tool path generation; Image edge detection; Lattices; Recycling; Rough surfaces; Shape; Surface roughness; Trajectory;
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