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Analysis of stray inductance's influence on SiC MOSFET switching performance

机译:杂散电感对SIC MOSFET切换性能影响的分析

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This paper mainly discusses the influence of stray inductance on the switching performance of SiC MOSFET. For package with three leads, stray inductance at the source electrode is shared by the driving path and power path, which can reduce the switching speed and lead to increased power loss. A double pulse test bench is designed to verify the analysis. Based on the test bench, a direct bond copper substrate is designed to eliminate the shared inductance.
机译:本文主要探讨了杂散电感对SiC MOSFET开关性能的影响。对于具有三个引线的包装,源电极处的杂散电感由驱动路径和电源路径共享,这可以降低开关速度并导致功率损耗增加。双脉冲测试台旨在验证分析。基于测试台,设计直接键铜基板以消除共用电感。

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