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Feng Shui of supercomputer memory positional effects in DRAM and SRAM faults

机译:风水对DRAM和SRAM故障中超级计算机内存位置的影响

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Several recent publications confirm that faults are common in high-performance computing systems. Therefore, further attention to the faults experienced by such computing systems is warranted. In this paper, we present a study of DRAM and SRAM faults in large high-performance computing systems. Our goal is to understand the factors that influence faults in production settings. We examine the impact of aging on DRAM, finding a marked shift from permanent to transient faults in the first two years of DRAM lifetime. We examine the impact of DRAM vendor, finding that fault rates vary by more than 4x among vendors. We examine the physical location of faults in a DRAM device and in a data center; contrary to prior studies, we find no correlations with either. Finally, we study the impact of altitude and rack placement on SRAM faults, finding that, as expected, altitude has a substantial impact on SRAM faults, and that top of rack placement correlates with 20% higher fault rate.
机译:最近的一些出版物证实了故障在高性能计算系统中很常见。因此,需要进一步注意这种计算系统所经历的故障。在本文中,我们对大型高性能计算系统中的DRAM和SRAM故障进行了研究。我们的目标是了解影响生产设置中故障的因素。我们检查了老化对DRAM的影响,发现在DRAM寿命的前两年中,从永久性故障过渡到了瞬时性故障。我们检查了DRAM供应商的影响,发现不同供应商之间的故障率相差4倍以上。我们检查故障在DRAM设备和数据中心中的物理位置;与先前的研究相反,我们发现两者均无相关性。最后,我们研究了海拔高度和机架放置对SRAM故障的影响,发现,正如预期的那样,海拔高度对SRAM故障有重大影响,并且机架顶部与更高的故障率相关20%。

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