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A novel physical defects recovery technique for FPGA-IP cores

机译:FPGA-IP核心的新型物理缺陷恢复技术

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FPGA fault detection consumes a great deal of test time compared with ASICs because FPGAs have complex structures. Re-placement and re-routing must be performed to avoid fault points, which causes an increase in recovery time and degrades performance. Therefore, we propose a fault detection method and develop placement and routing tools to avoid fault sources in tile and multiplexer level avoidance, respectively. In the evaluation, the detection method diagnosed faulty MUXes with six test configurations. We found that the performance of a faulty FPGA slightly decreased by 2% compared with a normal FPGA in multiplexer level avoidance.
机译:与ASIC相比,FPGA故障检测消耗大量的测试时间,因为FPGA具有复杂的结构。 必须执行重新放置和重新路由以避免故障点,这导致恢复时间的增加并降低性能。 因此,我们提出了故障检测方法,开发放置和路由工具,以避免瓷砖和多路复用电平避免故障源。 在评估中,检测方法具有六个测试配置的诊断出故障的MUXES。 我们发现,与多路复用器级别避免的正常FPGA相比,故障FPGA的性能略微下降2%。

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