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PushPull: Short Path Padding for Timing Error Resilient Circuits

机译:PushPull:时序误差弹性电路的短路径填充

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Modern IC designs are exposed to a wide range of dynamic variations. Traditionally, a conservative timing guardband is required to guarantee correct operations under the worst-case variation, thus leading to performance degradation. To remove the guardband, resilient circuits are proposed. However, the short path padding (hold time fixing) problem in resilient circuits is severer than conventional IC design. Therefore, in this paper, we focus on the short path padding problem to enable the timing error detection and correction mechanism of resilient circuits. Unlike recent prior work adopts greedy heuristics with a local view, we determine the padding values and locations with a global view. Moreover, we propose coarse-grained and fine-grained padding allocation methods to further achieve the derived padding values at physical implementation. Experimental results show that our method is promising to validate timing error resilient circuits.
机译:现代IC设计暴露于各种动态变化。传统上,需要保守的时序保护带,以保证在最坏情况变化下的正确操作,从而导致性能下降。为了拆下保护带,提出了弹性电路。然而,弹性电路中的短路填充(保持时间固定)问题比传统IC设计更严重。因此,在本文中,我们专注于短路填充问题,以实现弹性电路的定时误差检测和校正机制。与最近的事先工作不同,通过本地视图采用贪婪的启发式,我们通过全局视图确定填充值和位置。此外,我们提出了粗粒细粒和细粒的填充分配方法,以进一步实现物理实现的衍生填充值。实验结果表明,我们的方法很有希望验证定时误差弹性电路。

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