TIMING ERROR SAMPLING GENERATOR, CRITICAL PATH MONITOR FOR HOLD AND SETUP VIOLATIONS OF AN INTEGRATED CIRCUIT AND A METHOD OF TIMING TESTING

摘要

A timing error sampling generator, a path monitor, an IC, a method of performing timing tests and a library of cells. In one embodiment, the timing error sampling generator includes: (1) a hold delay element having an input and an output and configured to provide a hold violation delayed signal at said output by providing a first predetermined delay to a clock signal received at said input, said first predetermined delay corresponding to a hold violation time for a path to be monitored and (2) a hold logic element having a first input coupled to said input of said hold delay element, a second input coupled to said output of said hold delay element and an output at which said hold logic element is configured to respond to said first and second inputs to provide a clock hold signal when logic levels at said first and second inputs are at a same level.