【24h】

Using the EEG Error Potential to Identify Interface Design Flaws

机译:使用EEG错误潜力识别接口设计缺陷

获取原文

摘要

There are a number of limitations to existing usability testing methods, including surveys, interviews, talk-alouds, and participant observations. These limitations include subject bias, poor recall, and inability to capture fleeting events, such as when a UI functions or behaves in a manner that contradicts user expectations. One possible solution to these problems is to use electrophy-siological indicators to monitor user interaction with the UI. We propose using event related potentials (ERP), and the error potential (ErrP) more specifically, to capture moment-to-moment interactions that lead to violations in user expectations. An ERP is a response generated in the brain to stimuli, while the ErrP is a more specific signal shown to be elicited by subject error. In this experiment we monitored subjects using a 10-channel electroencephalogram (EEG) as they completed a range of simple web browsing tasks. However, roughly 1/3 of the time subjects were confronted with poor UI design features (e.g., broken links). We then used statistical and machine learning techniques to classify the data and found that we were able to accurately identify the presence of error potentials. Furthermore, the ErrP was present when the subjects encountered a UI design flaw, but only during the more 'overt' examples of our design flaws. Results support our hypothesis that ERPs and ErrPs, can be used to identify UI design flaws for a variety of systems, from web sites to video games.
机译:现有的可用性测试方法有很多局限性,包括调查,访谈,对话和参与者观察。这些限制包括主题偏见,召回率差以及无法捕获短暂事件,例如当UI以与用户期望相抵触的方式运行或表现时。解决这些问题的一种可能的方法是使用电生理指标来监视用户与UI的交互。我们建议更具体地使用事件相关电势(ERP)和错误电势(ErrP),以捕获导致用户期望违规的时刻到时刻的交互。 ERP是在大脑中产生的对刺激的反应,而ErrP是更具体的信号,显示是由受试者错误引起的。在此实验中,我们使用10通道脑电图(EEG)来监视受试者,因为他们完成了一系列简单的Web浏览任务。但是,大约有1/3的时间对象面临不良的UI设计功能(例如,断开的链接)。然后,我们使用统计和机器学习技术对数据进行分类,发现我们能够准确地识别潜在的错误。此外,当主题遇到UI设计缺陷时,ErrP就会出现,但仅在我们设计缺陷的“更公开”示例中出现。结果支持我们的假设:ERP和ErrPs可用于识别从网站到视频游戏的各种系统的UI设计缺陷。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号