Detection and Localization of Faults in Analog Integrated Circuits by Utilizing the Combined Effect of Output Voltage Gain and Phase Variation with Frequency

摘要

In this paper, we have introduced a new technique based on simultaneous analysis of output voltage gain vs. frequency and phase vs. frequency for fault testing of analog integrated circuits. An Automated Test Frequency Generation method is demonstrated here to select minimum number of test frequencies as stimuli. The introduced technique is applied to three benchmark circuits and the obtained results are then compared to the results from gain vs. frequency and phase vs. frequency analysis methods. From the comparison, the proposed technique is found to be superior over the gain technique in detection and localization of faults. Finally, a method for identification and localization of faults by clustering is exhibited, which utilizes our proposed technique for better performance.