This paper presents solutions to reduce measurement error and test time in an AC characteristic test of a source-synchronous device. In order to realize such a solution, we developed a multi strobe circuit which detects a phase difference between output clock and output data at a test cycle in real time without strobe scanning. We implemented a digital delay locked loop for precise multi strobe circuit. We achieved less than 1/5 the measurement error and less than 1/16 the test time compared with the conventional test method.
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