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Exploration and evaluation of low-dropout linear voltage regulator with FinFET, TFET and hybrid TFET-FinFET implementations

机译:用FINFET,TFET和Hybrid TFET-FINFET实现探索和评估低压辐射线性稳压器

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This paper investigates and evaluates analog and digital low-dropout linear voltage regulators (LDO) with FinFET, TFET and hybrid TFET-FinFET implementations. We utilize Sentaurus physics-based atomistic 3D TCAD mixed-mode simulations for device characteristics and HSPICE with look-up tables based on Verilog-A models calibrated with TCAD simulation results. Frequency response, load regulation and power supply rejection ratio (PSRR) are evaluated for analog LDOs under low, medium and high bias-current conditions. The results indicate that for analog implementations, TFET-LDO and hybrid-LDO provide better loop-gain and PSRR than FinFET-LDO under low and medium operating currents, whereas at higher operating current, FinFET implementation would outperform. As operating voltage is reduced, the performances of analog implementations degrade, and digital implementations become favorable for VIN below around 0.55V. We further show that for digital LDO, all FinFET implementation provides superior performance over all TFET and hybrid TFET-FinFET implementations.
机译:本文调整和评估了用FinFET,TFET和Hybrid TFET-FinFET实现的模拟和数字低压丢失线性电压调节器(LDO)。我们利用Sentaurus物理基原子型3D TCAD混合模式模拟,具有基于Verilog的查找表的设备特性和Hspice - 使用TCAD仿真结果进行校准的型号。频率响应,负载调节和电源抑制比(PSRR)在低,中等和高偏压条件下进行模拟LDO。结果表明,对于模拟实现中,TFET-LDO和混合LDO提供下低和中等的工作电流更好环路增益和PSRR比的FinFET-LDO,而在较高的工作电流,鳍式场效应晶体管实现将超越。随着工作电压降低,模拟实现的性能降低,数字实施方式在低于约0.55V的VIN上变得有利。我们进一步表明,对于数字LDO,所有FinFET实现都可以对所有TFET和混合TFET-FinFET实现提供卓越的性能。

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